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Model | T450 plus | T450S plus |
Composition analysis and testing | S(16)-U(92) | Al(13)-U(92) |
Coating layer analysis | Li(3)-U(92) | |
ROHS Testing | Standard, with a minimum detection limit of 2ppm. | Standard, with a minimum detection limit of 1ppm. |
Algorithm | Enhanced FP algorithm | |
Analysis Software | Analyses up to 15 layers and 24 elements simultaneously | |
Radiation Direction | Bottom to top | |
X-ray generator | Microfocus Enhanced Ray Tube | |
Detectors | High Performance Si-Pin Semiconductor Detectors | FAST SDD detector |
High voltage | 0-50KV Intelligent Programmable High Voltage System | |
Collimator | φ0.3mm(φ0.2mm)/φ0.5mm/φ3mm multi-accurate automatic switching | |
Sample observation | Industrial CCD high-definition camera | |
Focusing mode | Manual focus | |
Magnification | Optical 30-50X, digital zoom 40-160X | |
Moving platform | Micron mobile platform | |
Operating environment temperature and humidity | 10~35℃, humidity≤70% | |
Power supply | AC 220±5V | |
High stability micro focusing integrated system | Adopting independently developed and designed high stability micro focusing enhanced radiation tube and focusing optical path system, the minimum measurement point can reach 0.25mm. | |
Equipped with high-performance detectors | The lowest resolution is 129eV ± 5eV, with excellent energy linearity and resolution, and higher stability and accuracy. | |
high-precision | The detection limit for content can reach 1ppm, and the detection limit for thickness can reach 1nm. | |











